An SQC/SPC/Event Analysis tool designed for use on the factory floor. The intuitive presentation of data uses product/customer specifications to help "find and fix" reasons for process/product variation. The Event analysis features of the product assist you in capturing accurate and detail data about failures such as downtime, defects and reject. Once collected the unique presentation tools help you to understand and correct these loses in efficiency.
The intuitive use of colors and symbols blended into the presentation of the data clearly highlight issues in the data. The use of statistical based rules quickly highlight "out of spec" or control situations. Using the statistical relationship feature helps you better understand the interactions between pieces of information you collect for a process or product.
The Application maintenance module provides you with the ability to tailor each use to your specific need, as well as a way of maintaining your customer and product specific information such as target, control and specification limits.
You can start with manual entry applications and then enhance them with interfaces devices such as scales and gauges. Accessing data from PLC's is also possible to greatly improve the accuracy and volume of data you can collect. The QW interface to a Pocket PC device lets you create portable QW data collectors making the capturing of data easier and more accurate.
Data collected can be exported to a variety of formats and an Excel data importer provides you with a fast method of reviewing any Excel based data and then saving it as a new QW application.
The support for both VB and Java scripting provides you a powerful integration option for the use of Quality Window into every aspect of your operation. This can be from interfaces to existing databases or creating customer specific outputs like Certificates of Analysis.
Keywords: Quality Control, SPC, SQC, Downtime, Defects, Rejects, Six Sigma, PLC, Reliability, Statistics
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